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  2. Application of Interferometry
  3. Application of Interferometry
Please use this identifier to cite or link to this item: http://localhost:80/xmlui/handle/123456789/2901
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dc.date.accessioned2024-12-07T06:20:56Z-
dc.date.available2024-12-07T06:20:56Z-
dc.date.issued1930-10-09-
dc.identifier.urihttp://localhost:80/xmlui/handle/123456789/2901-
dc.language.isoen_USen_US
dc.publisherMethuen & Co. Ltd: New York: John Wiley & Sons inc.en_US
dc.subjectSpectroscopy, Amplitudes etc.en_US
dc.titleApplication of Interferometryen_US
dc.typeBooken_US
Appears in Collections:Application of Interferometry

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